Federico Di Palma Papers on DiSC'06 Process Diagnosis via Electrical-Wafer-Sorting Maps Classification Publications Note: Links lead to the DBLP on the Web. Federico Di Palma Federico Di Palma, Giuseppe De Nicolao , Guido Miraglia , Oliver M. Donzelli : Process Diagnosis via Electrical-Wafer-Sorting Maps Classification. ICDM 2005 : 601-604 Federico Di Palma, Giuseppe De Nicolao , Guido Miraglia , Egidio Pasquinetti , Francesco Piccinini : Unsupervised spatial pattern classification of electrical-wafer-sorting maps in semiconductor manufacturing. Pattern Recognition Letters 26 (12): 1857-1865 (2005) 1 [ 2 ] 2 [ 1 ] [ 2 ] 3 [ 1 ] [ 2 ] 4 [ 1 ] 5 [ 1 ] ©2006 Association for Computing Machinery