Giuseppe De Nicolao Papers on DiSC'06 Process Diagnosis via Electrical-Wafer-Sorting Maps Classification Publications Note: Links lead to the DBLP on the Web. Giuseppe De Nicolao Federico Di Palma , Giuseppe De Nicolao, Guido Miraglia , Oliver M. Donzelli : Process Diagnosis via Electrical-Wafer-Sorting Maps Classification. ICDM 2005 : 601-604 Federico Di Palma , Giuseppe De Nicolao, Guido Miraglia , Egidio Pasquinetti , Francesco Piccinini : Unsupervised spatial pattern classification of electrical-wafer-sorting maps in semiconductor manufacturing. Pattern Recognition Letters 26 (12): 1857-1865 (2005) Riccardo Bellazzi , Cristiana Larizza , Paolo Magni , Stefania Montani , Giuseppe De Nicolao: Intelligent Analysis of Clinical Time Series by Combining Structural Filtering and Temporal Abstractions. AIMDM 1999 : 261-270 Paolo Magni , Riccardo Bellazzi , Giuseppe De Nicolao: Bayesian Function Learning Using MCMC Methods. IEEE Trans. Pattern Anal. Mach. Intell. 20 (12): 1319-1331 (1998) Riccardo Bellazzi , Paolo Magni , Giuseppe De Nicolao: Dynamic Probabilistic Networks for Modelling and Identifying Dynamic Systems: a MCMC Approach. Intell. Data Anal. 1 (1-4): 245-262 (1997) Riccardo Bellazzi , C. Siviero , Mario Stefanelli , Giuseppe De Nicolao: Adaptive controllers for intelligent monitoring. Artificial Intelligence in Medicine 7 (6): 515-540 (1995) 1 [ 1 ] [ 2 ] [ 3 ] [ 4 ] 2 [ 6 ] 3 [ 4 ] 4 [ 2 ] [ 3 ] [ 4 ] 5 [ 5 ] [ 6 ] 6 [ 4 ] 7 [ 5 ] [ 6 ] 8 [ 5 ] 9 [ 5 ] 10 [ 1 ] 11 [ 1 ] ©2006 Association for Computing Machinery