ICDM'05 - Session 20: Data Mining Applications Mining Patterns of Change in Remote Sensing Image Databases Marcelino Pereira S. Silva Gilberto Cāra Ricardo Cartaxo M. Souza Dalton M. Valeriano Maria Isabel S. Escada Average Number of Frequent (Closed) Patterns in Bernouilli and Markovian Databases Loick Lhote Francois Rioult Arnaud Soulet Process Diagnosis via Electrical-Wafer-Sorting Maps Classification Federico Di Palma Giuseppe De Nicolao Guido Miraglia Predicting Software Escalations with Maximum ROI Charles X. Ling Shengli Sheng Tilmann F. W. Bruckhaus Nazim H. Madhavji AMIOT: Induced Ordered Tree Mining in Tree-structured Databases Shohei Hido Hiroyuki Kawano Return to ICDM'05 session listing ©2006 Association for Computing Machinery